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Final Conference ScheduleOpen print version   

Updated on September 12, 2006

THURSDAY 14 th September 2006
      
8:00 - 12:30 REGISTRATION
      
9:00 - 10:30 SYMPOSIUM OPENING
Prof. R. Vrba, Prof. V. Musil, Prof. J. Šikula
      
  Invited papers
 
Latest achievments in organic semiconductors for future electronic devices
Weiter M.,
Brno University of Technology, Czech Republic
 
Carbon nanotubes deposition by plasma enhanced chemical vapor deposition
Jašek O.,
Masaryk University, Czech Republic
      
10:30 – 11:30 COFFE BREAK - POSTERS SESSION No. 1
      
11:30 - 12:40 Invited papers
 
Study of deep levels in CdTe by thermoelectric effect spectroscopy
Franc J.,
Elhadidy H., Moravec P., Charles University, Czech Republic
 
Mikro- and nanofilm integration on substrate from 96 % spinel for sensor arrays
Heřmanský Vojtěch,
Strobl K., Kroulík M., Exnar P., ELCERAM Hradec Králové, Czech Republic
 
12:40 - 14:00 LUNCH
 
14:00 - 15:40 Parallel session I.
Chairman: L. Gajdošík
 
A concept of accelerator for Kohonen Self-Organizing Maps
Bártů M.,
Tučková J., Šťastný J., Czech Technical University, Czech Republic
 
MCS430 Microcontroller Power Requirements: A Case Study
Dudáček K.,
Vavřička V., University of West Bohemia, Czech Republic
 
Universal filter with transconductance amplifier
Gajdošík L.,
Technical University of Ostrava, Czech Republic
 
Two-Dimensional Weighted Median Filters – Phase Characteristics
Sawicki J.,
Poznan University of Technology, Poland
 
Determination of Pin Types and Minimisation of Test Vectors in Unknown CMOS Integrated Circuits
Brutscheck M., Franke M., Schwarzbacher A. Th., Becker S., Dublin Institute of Technology, Ireland
   
14:00 - 15:40 Parallel session II.
Chairman: J. Franc
 
U ltrasonic method for fluid velocity measurement
Vavřička V.,
Dudáček K., University of West Bohemia, Czech Republic
 
Screening effects in high-resistivity CdTe
Kubát J., Franc J., Hlídek P., Grill R., Charles University, Czech Republic
 
Low frequency noise in submicron MOSFETs
Pavelka J.,
Šikula J., Tacano M., CNRL, Czech Republic
 
Improved determination of phosphorus cross-contamination in antimony implantation using spreading resistance profiling
Kuruc M.,
Hulényi L., Kinder R., Slovak University of Technology, Slovak Republic
 
Model-Based Testing and Design Evaluation of Mixed-Signal Devices: an ADC Example
Subrt O., Martinek P., Wegener C.
  
15:40 - 16:40 COFFE BREAK - POSTERS SESSION No.2
      
16:40 - 17:40 Plenary session III.
Chairman: V. Ac
 
Charge carrier transport and reliability of Ta and NbO capacitors
Sikula J.,
Sedlakova V., Brno University of Technology, Czech Republic
 
SAW-based Chemical Sensors
Laposa A.,
Husák M., Czech Technical University in Prague, Czech Republic
 
Sensing properties of WO3 films for monitoring ozone
Vallejos S.,
Khatko V., Aguir K., Stankova M., Ngo K., Calderer J., Llobet E., Correig X., University Rovira i Virgili, Tarragona, Spain
  Establishing Certified Quality System in the Technology Companies
Očenášek P., Kubát L., Brno University of Technology, Czech Republic
  
17:45 - 18:20 General Meeting of IMAPS Czech & Slovak Chapter
      
18:30 - 23:30 Social Evening (Departure from Technická 8 to Hustopeče)
  
FRIDAY 15 th September 2006
      
9:30 - 10:30 Plenary session V.
Chairman: R. Kinder
 
Real Modeling and Optimized Design of Analogue Circuits Using Differential Evolutionary Algorithms
Martínek P.,
Maršík J., Czech Technical University in Prague, Czech Republic
 
Operational Transconductance Amplifiers for Gm-C filters working in the band up to 100MHz
Sedlář J.,
Martínek P., Czech Technical University in Prague, Czech Republic
 
Optimization of Ni/Si ohmic contact on SiC

Macháč P., Barda B., Institute of Chemical Technology, Czech Republic
      
10:30 - 11:30 COFFE BREAK - POSTERS SESSION No.3
      
11:30 - 12:30 Plenary session VI.
Chairman: D. Gevaert
 
Full Custom CMOS Design of a low power high speed 12-bit A/D Converter in current mode folding
Gevaert D.,
KHBO, Belgium
 
Log-Domain CMOS Multiplier for an Analog Current Mode Linearization
Bouřa A.,
Husák M., Czech Technical University in Prague, Czech Republic
 
Bandpass Sigma-Delta Modulator for Capacitive Pressure Sensor
Háze J.,
Vrba R., Forejtek J., Zavoral P., Fujcik L., Pavlík M., Michaeli L., Brno University of Technology, Czech Republic
  
12:30 - 13:00 CLOSING CEREMONY
  
13:00 - 14:00 LUNCH

Note: Oral Presentation of every participant's should take 20 min
 
POSTERS SESSIONS


The poster hall will be opened for setting Posters session No.1 on Thursday, 14 th September, 2006.
The posters should be available for visitors from 9:00 to 13:00.

Posters for The Posters session No.2 should be available for visitors from 14:00 to 17:00.

Posters for The Posters session No.3 should be hung from 17:00 for Friday session. Authors are expected to be next to her/his poster on

Thursday, 14th September, 2006, from 10:30 to 11:30

Thursday, 14th September, 2006, from 15:40 to 16:40

Friday, 15th September, 2006, from 10:30 to 11:30

The poster number will be determined during registration on the conference desk.

The poster boards are 95 cm wide and 120 cm high. Recommended poster size: 80 x 120 cm

 
POSTERS SESSION No.1

Application of ceramic-filled photosensitive materials for embedded components
Hamáček A., Řeboun J., Skocil V.

Digital Signal Processor in Modern AC Regulation Drives
Moravcik P., Osmancik L., Palacky P.

Tools for signal analysis of gas senzor
Bláha M., Hasse L., Smulko J.

Sensor Networking through Intranet and ZigBee
Trchalik R., Švéda M.

FlexRay Communication Development
Malinský J.

Graphic User Interface for Simulation of Fiber Bragg Gratings
Helán R., Urban F.

Intelligent Security System with GSM Using
Kroutil J., Husák M.

Development of Microfluidic Analytical System for Cell Electrolysis
Grym J., Svobodová I., Klepárník K., Foret F.

New precise intrumentation for electrochemical analysis
Steffan, P., Vrba R., Havlicek, T., Prokop R., Hubalek J.

Programming device for measuring ASIC
Steffan P., Fujcik L., Prokop R., Magat M.

LBIC method with different wavelength of light source
Vanek J, Fort T., Kubickova K., Barinka R.

Thermal cycling and lifetime testing of solar cell's solder joints
Jakubka L., Linhart J., Szendiuch I.

Screen Printed Diffusion Boron Paste
Jakubka L., Linhart J., Szendiuch I.

Tips chip measuring unit
Pavlík M., Magát M., Vrba R.

Measuring electronics for apex chip measuring unit
Magát M., Pavlík M., Vrba R.

Carbon nanotubes: Preparation and measurement of their electrical properties for pressure sensor application
Ficek R., Vrba R., Bo-Hyun Kim R., Stephen M. Goodnick S.M., Milicic S., Kučerová Z., Lenka Zajíčková L., Eliáš M.

Template based technique for thin-film high surface formation by nanopillars
Hubálek J., Klosová K., Hrdý R.

Design of Current Conveyor based on Operational Amplifier
Eldbib I., A. Khateb A.

Low-cost microcontroller as logic replacement
Mougel T.

Inhalation Narcotic Feeder for Small Mammals
Vašková L., Hovorka J., Vojtíšek L., Smrčka P., Hána K.

Centralised diagnostics of electronic and electric equipment in vehicles
Ježdík P.

Novel Digital White Noise Source
Neškudla J., Vedral J.

Quality Testing of 24 Bit Audio Codecs
Vedral J., Neškudla J.


Reactive Magnetron Sputtering Silicon Nitride Layers for Passivation of Crystalline Silicon Solar Cells
Hégr O., Boušek J. , Sobota J., Bařinka R. and Poruba A.


ECG Measurement During the MRI Experiments
Vojtíšek L. , Brich T. ,Kašpar J. , Brada J.

 
POSTERS SESSION No.2

Current-Mode CDTA-Based Comparators
Biolek D., Biolková V.

Reduction of the Noise by Combination of Parallel Signal Processing and Thresholding in Frequency Area
Hájek K.

Multi-input operational amplifier with differential output in active filter with fully differential signal path
Holajn P.

The synthetic elements with transimpedance operational amplifiers
Murina M., Steinbauer M.

Chain Matrix Derivative via Laplace Transform Method with Applications to Distributed Circuits Simulation
Brančík L.

Image processing by using the neural networks simulator
Ďuračková D., Grega P.

Test Generation Experiments for Delay Faults in Digital Circuits
Gramatová E.

Real Parameters of Active Filter Sections Used by Non-Cascade Synthesis
Hájek K., Michal V., Sedláček J.

An automatic measurement system with PCIV profiling for characterization of semiconductors
Kinder R., Hudec L., Chmel T., Hulenyi L., Kuruc M.

Ohmic contact of Si/Pd type on GaAs
Macháč P.

Electrical Characterization of 4H-SiC Schottky Diodes with a RuO 2 and a RuWO X Schotky Contacts
Stuchlíková Ľ., Harmatha L., Búc D., Benkovská J.

Boron oxides films prepared by magnetron sputtering
Buc D., Bellob I., Mikula M., Kovac J., Caplovicovac M., Hotovy I.

Czochralski-grown nitrogen-doped silicon: Electrical properties of MOS structures before and after rapid thermal annealing
Stuchlíková Ľ., Harmatha L., Ballo P., Benkovský I., Ťapajna M., Písečný P.

Numerical Simulation of CaCl 2 .6H 2 O Phase Change
Behunek I., Fiala P.

Solution of Turbulence by Means of FEM
Behunek I., Fiala P.

Measuring Thermomechanical Reliability of The Solder Joint in Electronic
Šandera J.

Identification of Defects in Materials Using EIT
Kubásek R., Bachorec T., Dědková J

Comparison of Different Types of AC/AC Converters
Lettl J., Fligl S., Kuzmanovic D.

Realized Matrix Converter Drive System
Lettl J., Fligl S.

Electromechanical converters theory as an educational task
Spałek D., Waleczek K.


Testing of Silicon Solar Cells Using Fast Transients
Bousek J. , Porub a A.


VHDL Design of Educational, Modern and Open-Architecture CPU
Straka M.


PC Supported Amplitude Analysis for the Partial Discharge Measurement
Havlíček T., Boušek J., Mammadov A.

 
POSTERS SESSION No.3

Towards interpretable results of symbolic analysis
Kolka Z.

Design and Implementation of a Defuzzifier Circuit in CMOS Technology
Rocha P., Botura G Jr., Mesquita L., Saotome O .

Measurement Methods of Air Ion Fields
Drexler P., Fiala P.

Internet Learning in Sensor Technic Area
Adámek M., Prášek J., Uhlár M., Luňáček E.

Mechanical strain sensor based on GMR
Ác V.

Firing temperature influence of ESL thick film pastes to calibration curve of electrochemical sensors
Adámek M., Prášek J., Uhlár M., Luňáček E.

Checking the Quality of Gradient Magnetic Fields in MR Thomography
Bartusek K., Gescheidtova E., Kubasek R

Study of Rotating Vessel Electrochemical Cell Properties for Thick-Film Sensors Measurement
Prasek J., Adamek M., Hubalek J.

Verification and simulation of material effects in NMR
Steinbauer M., Bartušek K.

Single electron transistor: principles and Spice simulations
Frodl M., Horák M.

Silicon-germanium heterojunction bipolar transistor: Simulation in Mathematica
Horák M., Hejátková E.

Bipolar junction transistor model for student computer training
Novosád J., Horák M.

Identifying and Measurement of Quantities in Pulsed Power Generators
Drexler P., Fiala P.

The optoelectronic systems as coupled problems
Drexler P., Kříž T., Fiala P., Kadlecová E.

Interaction of Solid Materials Inhomogenities with Microwaves
Faktorová D.

Planar Lightwave Hybrid Integration Circuits
Jeřábek V., Hüttel I., Prajzler V., Burian Z., Arciniega J.A.

Properties of Sputtered Carbon Layers Containing Erbium and Ytterbium
Ions

Prajzler V., Hüttel I., Špirková J., Oswald J., Peřina V.,
Machovič V., Jeřábek V.

Modification of Refractive Index of Polymethylmethacrylate by Applying Electric Field
Prajzler V., Hüttel I., Špirková J., Myslík M., Lutakov O., Burian Z.

The light source for the experimental application
Steinbauer M., Kadlecová E.

Implementation of a DSP based medical X-ray machine control system
Feng Q., Zhang D.

The distortion produced by the electric drive with double fed machine
Pittermann M., Drábek P., Fořt J., Janda M., Diesl J.

New Inteligent Instrumentation for Precise Measurements with Electrode Mirosystem at Wide Range of Conductivity
Hubálek J., Kuchta R.

Behaviour Analysis of Active Front End Rectifier under Unbalanced Input Voltage Conditions
Kocman S.

Passivation Quality Test by Noise Method
Vanek J., Kazelle J., Chobola Z., Jurankova V.


Degradation Tests of Mono Crystalline Solar Cells Panel's Layers and Sheets
Vanek J,. Kazelle J.,Sevcik R.


An automatic measurement system with PCIV profiling for characterization of semiconductors
Kinder R., Hudec L., Chmel T., Hulenyi L., Kuruc M.